Optical Emission Spectrometer

High Analytical Performance: Analyze a wide range of elements with low detection limits.
Fast Throughput: Rapid results reduce downtime and improve productivity.
Advanced Detectors: Our spectrometers use CCD and CMOS detectors, which capture more wavelengths with higher resolution than older technologies like PMTs.
Automation Options: Automated sample handling and analysis for maximum efficiency.

Technical assistance with equipment selection

Manufacturer warranties on all equipment

On-site or installation and hands-on training

Technical Specifications

Parameter	Technical Specification
Equipment Type	Optical Emission Spectrometer
Model	OES 8000
Technology	Multi-CCD detector with total spectrum technology
Analysis Method	Spark Optical Emission Spectroscopy
Suitable Materials	Ferrous and non-ferrous metals
Element Detection	Wide elemental coverage within the instrument wavelength range
Detector System	Multi-CCD detector
Detector Type	Toshiba CCD detector
Optical System	Polychromator optical system
Grating / Lens	Carl Zeiss grating and optical lens
Optical Fiber	Agilent optical fiber
Wavelength Coverage	Extended wavelength range for complex metal analysis
Spectral Detection	Detects spectral lines within the wavelength range
Resolution	10 pm/pixel
Analysis Time	Approximately 35 seconds per test
Vacuum System	No vacuum pump required
Optical Chamber	Vacuum-sealed chamber not required
Reliability	Designed for continuous 24/7 operation
Repeatability	Excellent repeatability for routine metal analysis
Instrument Design	Compact benchtop design
Sample Type	Solid metal samples
Main Applications	Metal grade identification, chemical composition analysis, inspection, sorting, process control, and R&D
Application Industries	Metallurgy, steel, foundry, metal casting, metal processing, ferrous metals, and non-ferrous metals