QE-CH200 Portable Combined UCI and Leeb Hardness Tester

A professional dual-method portable hardness tester combining Ultrasonic Contact Impedance (UCI) and Leeb rebound measurement in one instrument. The QE-CH200 is designed for field and production testing of thin, small, polished, surface-hardened and complex components, as well as large castings, forgings, pipelines and installed machinery.

Key Product Information

Test methods UCI and Leeb rebound
Displayed hardness ranges 20–70 HRC, 8–650 HB, 8–1500 HV
Standard UCI probe Type A, HV5, 50 N/5 kgf
Standard Leeb device Type D
Typical measurement time Approximately 2 seconds
Reading average Selectable from 1–99 measurements
Internal memory 12,400 readings
Named data blocks Up to 100
Data output USB connection to PC
Power Rechargeable Li-ion battery

Canadian Support

Technical assistance with equipment selection

Warranty Included

Manufacturer warranties on all equipment

Installation & Training

On-site or installation and hands-on training

Technical Specifications

Measurement methods UCI and Leeb rebound
Rockwell C range 20–70 HRC
Brinell display/conversion range 8–650 HB
Vickers display/conversion range 8–1500 HV
Typical relative average error 3–5% with regular calibration
Measurement duration Approximately 2 seconds
Measurement area From 1 mm on a flat surface; from 5 mm inside a slot
Measurements used for averaging 1–99
Internal memory 12,400 readings
Named measurement blocks Up to 100
User calibrations Five for each hardness scale
Additional user-defined scales Three
Data connection USB to PC
Power supply Rechargeable Li-ion battery
Electronic unit dimensions 121 × 69 × 41 mm
Electronic unit weight Approximately 0.3 kg
Standard UCI probe weight Approximately 0.3 kg
Standard Leeb D device weight Approximately 0.15 kg
Operating temperature −15 to +35 °C
Warranty 12 months

Measurement results outside verified reference ranges may involve conversion or extrapolation. Confirm their acceptability under the applicable inspection procedure.

Probe Selection

Probe Method and Load Typical Minimum Condition Recommended Application
UCI A HV5, 50 N/5 kgf 1 kg; 3 mm; Ra 1.6 General UCI hardness testing
UCI H HV1, 10 N/1 kgf 1 kg; 2 mm; Ra 0.8 Thin components, coatings and hardened layers
UCI C HV10, 100 N/10 kgf 1 kg; 4 mm; Ra 3.2 Less-prepared surfaces and heavy parts
UCI K HV5, 50 N/5 kgf 1 kg; 3 mm; Ra 1.6 Internal surfaces of tubes and tanks
UCI AL HV5, 50 N/5 kgf 1 kg; 3 mm; Ra 1.6 Grooves, pinholes and between gear teeth
Leeb D Standard impact device 3 kg; 6 mm; Ra 3.2 General rebound hardness testing
Leeb E High-hardness impact device 3 kg; 6 mm; Ra 3.2 High-hardness materials
Leeb G Higher-impact device 8 kg; 55 mm; Ra 7.6 Large, rough or inhomogeneous components

Minimum conditions are application guidance. Component support, coupling, curvature and material properties can affect suitability.

Applicable Standards

ASTM A1038 Portable hardness testing using the UCI method
DIN 50159 UCI hardness testing of metallic materials
ASTM A956 Leeb rebound hardness testing of steel products
ISO 16859 Leeb hardness testing of metallic materials
ASTM E140 Hardness conversion tables for metals
ISO 18265 Conversion of hardness values for metallic materials

Compliance requires the appropriate probe, surface condition, calibration, reference blocks and inspection procedure.

UCI or Leeb: Which Method Should Be Used?

Workpiece or Condition Recommended Method Reason
Thin, small or lightweight component UCI Lower thickness and mass requirements
Surface-hardened layer or electroplated surface UCI Small indentation and controlled test load
Gear tooth, groove, bore or restricted location UCI with specialized probe Better access to localized test areas
Large casting, forging or shaft Leeb Rapid rebound testing on heavy components
Pipeline, rail or installed machinery Leeb Suitable for large components that cannot be moved
Rough or structurally inhomogeneous component Leeb G option Higher-impact device for heavy, rough sections

Applications

  • Heat-treated and surface-hardened components
  • Thin-walled and lightweight metal parts
  • Gear teeth, shafts, grooves and blind holes
  • Electroplated and coated metallic surfaces
  • Castings, forgings and welded structures
  • Stainless steel and corrosion-resistant alloys
  • Cast iron, aluminum, bronze, brass and copper alloys
  • Pipelines, rails and construction components
  • Production quality control
  • Incoming material inspection
  • Maintenance and field inspection
  • Aerospace, shipbuilding, power generation and oil and gas

What's Included

✓ QE-CH200 electronic display unit

✓ UCI A probe — HV5, 50 N/5 kgf

✓ Type D Leeb impact device

✓ Probe connection cables

✓ Rechargeable Li-ion battery

✓ Battery charger

✓ USB PC connection cable

✓ Data-management software

✓ Protective carrying and storage case

✓ Operating manual

✓ Factory test certificate

Downloads

Brochure

QE-CH200 Portable Combined UCI and Leeb Hardness Tester

Why Choose This Model?

Two Testing Methods

Switch between UCI and Leeb testing using one electronic display unit, reducing the need to purchase and carry two separate instruments.

Thin to Heavy Components

Use UCI for thin, lightweight, polished and surface-hardened components. Use Leeb for large, heavy and rough industrial parts.

Fast and Efficient

Obtain readings in approximately two seconds, calculate averages and organize up to 12,400 stored measurements.

Built for Field Inspection

Compact battery-powered construction, physical operating buttons, a bright colour display and USB data transfer support production and on-site inspection.

Need help selecting the right configuration?

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    Frequently Asked Questions

    UCI uses a controlled-load diamond indenter and is better suited to thin, small, polished, surface-hardened or complex components. Leeb measures the rebound of an impact body and is generally better suited to large and heavy components.

    The standard configuration includes an HV5, 50 N UCI A probe and a Type D Leeb impact device.

    Yes. The UCI method is intended for thinner and smaller components. The exact minimum thickness depends on the selected probe, material, surface condition and how the component is supported.

    Yes. The Type D Leeb device is suitable for many large castings and forgings. A Type G device may be recommended for particularly large, rough or structurally inhomogeneous components.

    Yes. The instrument stores up to 12,400 readings in as many as 100 named data blocks.

    Why Buy From QMN Equipment?

    Equipment selected by testing professionals. Backed by CMH MetLabs expertise in:

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